HP-SpcQE Spectral Quantum Efficiency (QE) Measurement System
Based on over a decade of R&D experience from our team, we proudly introduce the brand-new HP-SpcQE Photodetector Quantum Efficiency Measurement System.
This measurement system is primarily designed to evaluate the photoelectric response performance of linear and area array CCD/CMOS image sensors, as well as single-element photodetectors. It measures key technical parameters including Spectral Responsivity (R), Quantum Efficiency (QE), Specific Detectivity (D*), Noise Equivalent Power (NEP), and Photoresponse Non-Uniformity (UNR / PRNU).
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01/Optimized, highly-integrated opto-electro-mechanical structure.
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02/Broad spectral measurement range from Ultraviolet (UV) to Short-Wave Infrared (SWIR).
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03/High illumination uniformity of up to 99% on the test plane.
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04/Spectral irradiance is traceable to National and NIST radiometric standards.
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05/Provides Dynamic Link Libraries (DLL) to facilitate secondary development.
Technical Specifications | Parameters |
Spectral Range (nm) | 250～1060，900～2500 |
Illumination Source | Halogen lamp, Xenon lamp, or EQ lamp (Optional) |
Spectral Bandwidth (nm) | 1～20 |
Scanning Step (nm | 1～20 |
Light Source Stability | 0.2%/h |
Spectral Resolution | 0.1nm@λ=546.1nm,0.2nm@λ=1092.2nm |
Wavelength Repeatability | 0.1nm@λ=546.1nm,0.2nm@λ=1092.2nm |
Wavelength Calibration Accuracy | 0.1nm@λ=546.1nm,0.2nm@λ=1092.2nm |
QE Measurement Uncertainty | 1.5%@λ=633nm |
Effective Test Sample Area (mm) | 20×20 |
Illumination Uniformity on Sample Plane | 0.99 |
Irradiance on Sample Plane | 5μW/cm²@λ=960nm |
Spectral Responsivity of Std. Detector | Traceable to National Metrology Standards |
Standard Detector Amplifier Noise | 1pA/Hz1/2 |
Communication Interface | RS232 or USB 2.0 |
Software | DLLSpectral scanning control, data acquisition, and data processing. Provides DLL for system control. |
Dimensions (L×W×H) (mm) | 600×600×800 |
Weight (kg) | 20 |
Power Supply | AC220V |
